Solid Sealing Technology Capabilities.
Experts in hermetic feedthroughs and connectors.
Solid Sealing Technology Capabilities.
Experts in hermetic feedthroughs and connectors.
Over the years xtronix has delivered many custom designed products, both systems and components. xtronix custom designs removes the burdensome task of design engineering, parts procurement, assembly, testing and final qualification. We work with suppliers, often companies we actively distribute products of, to obtain the best price and delivery, leaving our customers more time to focus on their own applications and less time worrying about all the intricacies of custom designs. Solid Sealing Technology (SST) partners with us for various custom feedthrough assemblies. Here is an overview of their capabilities:
The Kelvin probe is a non-contact, non-destructive vibrating capacitor device used to measure the work function (wf) of conducting materials or surface potential (sp) of semiconductor or insulating surfaces. The wf of a surface is typically defined by the topmost 1 - 3 layers of atoms or molecules, so the Kelvin probe is one of the most sensitive surface analysis techniques available. KP Technology systems offer a very high wf resolution of 1 - 3 meV, currently the highest achieved by any commercial device.
The Kelvin probe does not actually touch the surface; rather an electrical contact is made to another part of the sample or sample holder. The probe tip is typically 0.2 - 2.0 mm away from the sample and it measures the 'traditional work function', i.e. that found in literature tables. Other techniques, using very sharp tips some 10's of nanometers away from the sample, measure very reduced and distorted work functions due to the close separation of tip and sample.
The Ф4 Ultra-high Vacuum Scanning Kelvin Probe system gives the user full access to work function measurements under vacuum with the ability to alter the temperature from 77 K to 860 K. The Kelvin probe measurement has resolution of 1 - 3 meV for a 2 mm tip on a conducting sample. The sample is mounted on a plate that is located on a motorized (x, y, z) translator attached to a stainless steel vacuum chamber. Phi 4 also comes with a photoemission spectroscopy system with a tunable source (3.4 - 7.0 eV). The deep ultra-violet (DUV) light spot measures approximately 3 x 4 mm. Absolute work function measurements can be obtained with this system in the range of 4.0 - 6.5 eV with an accuracy of 0.05 - 0.1 eV.
The system can be upgraded with surface photovoltage spectroscopy through utilizing other ports in the system chamber. Liquid nitrogen is used as the method of cooling the sample and heating is achieved by controllable direct current. Nitrogen gas is used to displace the oxygen to facilitate the use of the photoemission system source. An optical breadboard is used to support the chamber and standard power is required for operation.