Monday, February 1, 2016

The Future of Thin Film Control

Eon-ID™ is a new film thickness controller that packages an ultra-high resolution deposition control system into a compact, rack-mountable enclosure.

Featuring integrated display, intuitive GUI, and durable architecture, Eon-ID™ offers an all-inclusive design that adapts easily to a variety of settings – ranging from industrial to laboratory to clean room to research environments. Eon-ID™ integrates well into existing rack thin film systems.

Employing a unique temperature compensation system to monitor the temperature of the Phoenix™ quartz crystal sensor, Eon-ID™ is the only comprehensive solution of its kind that is capable of real-time temperature measurement and source control.

Features include:
  • Integrated display to fit greater variety of settings and applications
  • Connectivity includes Ethernet, USB, and WiFi.
  • New, easy-to-use interface
  • Rackmount capable (standard 19” 5U high rack, two Eon-IDs per rack slot)
  • Dual channels for expanded capability
  • Advanced technology that increases reliability and durability in industrial environments
  • Temperature monitoring system that reads crystal to within +/- 1°C accuracy
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